A lattice attenuation in Cds measured by the ultrasonic injection method

摘要

This paper concerns the use of Brillouin scattering measurements to study lattice attenuation in semiconducting CdS crystals. Measured acoustic fluxes are produced by the acoustoelectric domains. In order to measure the attenuation constant, an ultrasonic injection method is applied. A sample is divided into two parts; one part is used as a generation region of the acoustic flux [region (1)] and the other part is used as a propagation region of the injected flux [region (2)]. The acoustic attenuations of various frequencies are measured at region (2). The lattice attenuation is greatly affected by the rise time of an applied pulse in region (1). It is clear that acoustic flux in the acoustic domain which originates from the amplification of the pure thermally excited acoustic flux attenuates as f2 and is in accordance with the Akhieser loss. On the other hand, a shock-excited acoustic flux attenuates as f ∼1.5.